• Device Name: Atomic Force Microscopy
• Device model: Standard
• Made by the company: Ara Research - Iran
• Operator: Marjan Jafari
• Time of use: all days of the week except holidays

• Description:
• Atomic force microscope (AFM) is used to investigate the properties and surface structure of materials in nanometer dimensions. It has flexibility, multiple possible signals, and the possibility of device operation in different contact and non-contact modes and in two user modes of constant force and constant height.